Investigation of CdZnTe Crystal Defects Using Scanning Probe Microscopy

Author(s)

Goutam Koley, University of South Carolina - ColumbiaFollow
J. Liu
K. C. Mandal, University of South Carolina - ColumbiaFollow

Document Type

Article

Subject Area(s)

Engineering, Electrical Engineering

Publication Info

Published in Applied Physics Letters, Volume 90, Issue 10, 2007, pages 102121-1-102121-3.

© Applied Physics Letters 2007, American Institute of Physics

Koley, G., Liu, J., & Mandal, K. C. (5 March 2007). Investigation of CdZnTe crystal defects using scanning probe microscopy. Applied Physics Letters, 90(10), #102121.

http://dx.doi.org/10.1063/1.2712496

http://scitation.aip.org/content/aip/journal/apl/90/10/10.1063/1.2712496

Rights

© Applied Physics Letters 2007, American Institute of Physics

Koley, G., Liu, J., & Mandal, K. C. (5 March 2007). Investigation of CdZnTe crystal defects using scanning probe microscopy. Applied Physics Letters, 90(10), #102121.

http://dx.doi.org/10.1063/1.2712496

http://scitation.aip.org/content/aip/journal/apl/90/10/10.1063/1.2712496