Document Type

Article

Subject Area(s)

Engineering, Electrical Engineering

Rights

© Applied Physics Letters 2007, American Institute of Physics

Koley, G., Liu, J., & Mandal, K. C. (5 March 2007). Investigation of CdZnTe crystal defects using scanning probe microscopy. Applied Physics Letters, 90(10), #102121.

http://dx.doi.org/10.1063/1.2712496

http://scitation.aip.org/content/aip/journal/apl/90/10/10.1063/1.2712496

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