Document Type
Article
Subject Area(s)
Engineering, Electrical Engineering
Publication Info
Published in Applied Physics Letters, Volume 90, Issue 10, 2007, pages 102121-1-102121-3.
Rights
© Applied Physics Letters 2007, American Institute of Physics
Koley, G., Liu, J., & Mandal, K. C. (5 March 2007). Investigation of CdZnTe crystal defects using scanning probe microscopy. Applied Physics Letters, 90(10), #102121.
http://dx.doi.org/10.1063/1.2712496
http://scitation.aip.org/content/aip/journal/apl/90/10/10.1063/1.2712496
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