Compact Model of Current Collapse in Heterostructure Field-Effect Transistors

Author(s)

A. Koudymov
M. S. Shur
Grigory Simin, University of South Carolina - ColumbiaFollow

Document Type

Article

Publication Info

Published in IEEE Electron Device Letters, Volume 28, Issue 5, 2007, pages 332-335.

Rights

©IEEE Electron Device Letters 2007, Institute of Electrical and Electronics Enhgineers (IEEE).

Koudymov, A., Shur, M. S., & Simin, G. (May 2007). Compact Model of Current Collapse in Heterostructure Field-Effect Transistors. IEEE Electron Device Letters, 28 (5), 332-335. http://dx.doi.org/10.1109/LED.2007.895389