Crystal growth and structure determination of the new silicate K3ScSi2O7
Document Type
Paper
Subject Area(s)
Chemistry
Abstract
Single crystals of the new three-dimensional silicate K3ScSi2O7 were obtained via a high temperature flux method and characterized by single crystal X-ray diffraction. K3ScSi2O7crystallizes in the space group P63/mmc with a = 5.60650(10) Å, c = 13.6420(4) Å. The structure contains sheets of ScO6 octahedra that are connected via Si2O7 bridging groups.
Publication Info
Published in Journal of Chemical Crystallography, Volume 34, Issue 6, 2004, pages 347-351.
© Journal of Chemical Crystallography 2004, SpingerLink
Napper, J. D., Layland, R. C., Smith, M. D., zur Loye, H.-C.,(2004). Crystal growth and structure determination of the new silicate K3ScSi2O7., 34(6), 347-351
https://dx.doi.org/10.1023/B:JOCC.0000028666.53348.fc
Rights
© Journal of Chemical Crystallography 2004, SpingerLink
Napper, J. D., Layland, R. C., Smith, M. D., zur Loye, H.-C.,(2004). Crystal growth and structure determination of the new silicate K3ScSi2O7., 34(6), 347-351
https://dx.doi.org/10.1023/B:JOCC.0000028666.53348.fc