Crystal growth and structure determination of the new silicate K3ScSi2O7

Author(s)

Hans Conrad zur Loye, University of South Carolina

Document Type

Paper

Subject Area(s)

Chemistry

Abstract

Single crystals of the new three-dimensional silicate K3ScSi2O7 were obtained via a high temperature flux method and characterized by single crystal X-ray diffraction. K3ScSi2O7crystallizes in the space group P63/mmc with a = 5.60650(10) Å, c = 13.6420(4) Å. The structure contains sheets of ScO6 octahedra that are connected via Si2O7 bridging groups.

Publication Info

Published in Journal of Chemical Crystallography, Volume 34, Issue 6, 2004, pages 347-351.

Rights

© Journal of Chemical Crystallography 2004, SpingerLink

Napper, J. D., Layland, R. C., Smith, M. D., zur Loye, H.-C.,(2004). Crystal growth and structure determination of the new silicate K3ScSi2O7., 34(6), 347-351

https://dx.doi.org/10.1023/B:JOCC.0000028666.53348.fc