Document Type
Article
Subject Area(s)
Applied Physics, Nanoscience, Nanotechnology
Abstract
Stimulated emission depletion (STED) microscopy is one of the breakthrough technologies that belong to far-field optical microscopy and can achieve nanoscale spatial resolution. We demonstrate a far-field optical nanoscopy based on continuous wave lasers with different wavelengths, i.e., violet and green lasers for excitation and STED, respectively. Fluorescent dyes Coumarin 102 and Atto 390 are used for validating the depletion efficiency. Fluorescent nanoparticles are selected for characterizing the spatial resolution of the STED system. Linear scanning of the laser beams of the STED system along one line of a microscope slide, which is coated with the nanoparticles, indicates that a spatial resolution of about 70 nm has so far been achieved. A two-dimensional image of the particle pattern of the STED system is constructed and compared with scanning confocal microscope. The present work has further extended the application of the STED microscopy into the blue regime.
Publication Info
Published in Review of Scientific Instruments, Volume 81, 2010, pages 053709-1-053709-4.
Rights
Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
The following article appeared in
Kuang, C., Zhao, W., & Wang, G. (2010). Far-field optical nanoscopy based on continuous wave laser stimulated emission depletion. Review of Scientific Instruments, 81, 053709. http://dx.doi.org/10.1063/1.3432001
and may be found at
http://scitation.aip.org/content/aip/journal/rsi/81/5/10.1063/1.3432001