Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000

Author(s)

Michael A. Sutton, University of South Carolina - ColumbiaFollow
N. Li
D. C. Joy
Anthony P. Reynolds, University of South Carolina - ColumbiaFollow
Xiaodong Li, University of South Carolina - ColumbiaFollow

Document Type

Article

Publication Info

Published in Experimental Mechanics, Volume 47, Issue 6, 2007, pages 775-787.

©Experimental Mechanics 2007, Springer.

Sutton, M. A., Li, N., Joy, D. C., Reynolds, A. P. & Li, X. (1 December 2007). Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000. Experimental Mechanics, 47 (60, 775 – 787. http://dx.doi.org/10.1007/s11340-007-9042-z

Rights

©Experimental Mechanics 2007, Springer.

Sutton, M. A., Li, N., Joy, D. C., Reynolds, A. P. & Li, X. (1 December 2007). Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I: SEM Imaging at Magnifications from 200 to 10,000. Experimental Mechanics, 47 (60, 775 – 787. http://dx.doi.org/10.1007/s11340-007-9042-z