High-Resolution x- and γ-ray Detection Using 4H-SiC n-type Epitaxial Layer

Author(s)

K. C. Mandal, University of South Carolina - ColumbiaFollow
P. G. Muzykov, University of South Carolina - ColumbiaFollow
S. K. Chaudhuri
J. R. Terry

Document Type

Article

Subject Area(s)

Electrical Engineering

Publication Info

Published in Nuclear Science Symposium and Medical Imaging Conference, 2012, pages 4216-4221.

© Nuclear Science Symposium and Medical Imaging Conference 2012, IEEE

Mandal, K. C., Muzykov, P. G., Chaudhuri, S. K., & Terry, J. R. (2012). High-resolution x- and γ-ray detection using 4H-SiC n-type epitaxial layer. Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE, 4216-4221.

http://dx.doi.org/10.1109/NSSMIC.2012.6551961

Rights

© Nuclear Science Symposium and Medical Imaging Conference 2012, IEEE

Mandal, K. C., Muzykov, P. G., Chaudhuri, S. K., & Terry, J. R. (2012). High-resolution x- and γ-ray detection using 4H-SiC n-type epitaxial layer. Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE, 4216-4221.

http://dx.doi.org/10.1109/NSSMIC.2012.6551961