Design, Fabrication, Characterization, and Evaluation of X-ray Detectors Based on n-type 4H-SiC Epitaxial Layer
Electrical Engineering, Electrochemistry
Published in ECS Transactions, Volume 45, Issue 7, 2012, pages 27-33.
© ECS Transactions 2012, The Society for Solid-State and Electrochemical Science and Technology
Mandal, K. C., Muzykov, P. G., & Terry, J. R. (2012). Design, fabrication, characterization, and evaluation of X-ray detectors based on n-type 4H-SiC epilayers. ECS Transactions, 45(7), 27-33.