Investigation of Nanoscale Electronic Properties of CdZnTe Crystals by Scanning Spreading Resistance Microscopy

Document Type

Article

Subject Area(s)

Semiconductor Science, Semiconductor Technology, Electrical Engineering, Optics

Rights

© Semiconductor Science and Technology 2009, IOP Publishing

Liu, J., Mandal, K. C., & Koley, G. (April 2009). Investigation of nanoscale electronic properties of CdZnTe crystals by scanning spreading resistance microscopy. Semiconductor Science and Technology, 24(4), #045012.

http://dx.doi.org/10.1088/0268-1242/24/4/045012

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