Investigation of Nanoscale Electronic Properties of CdZnTe Crystals by Scanning Spreading Resistance Microscopy
Document Type
Article
Subject Area(s)
Semiconductor Science, Semiconductor Technology, Electrical Engineering, Optics
Publication Info
Published in Semiconductor Science and Technology, Volume 24, Issue 4, 2009, pages 045012-1-045012-5.
Rights
© Semiconductor Science and Technology 2009, IOP Publishing
Liu, J., Mandal, K. C., & Koley, G. (April 2009). Investigation of nanoscale electronic properties of CdZnTe crystals by scanning spreading resistance microscopy. Semiconductor Science and Technology, 24(4), #045012.
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