Document Type

Article

Subject Area(s)

Engineering, Electrical Engineering

Rights

© Journal of Applied Physics 2009, American Institute of Physics

Cui, Y., Caudel, D. D., Bhattacharya, P., Burger, A., Mandal, K. C., Johnstone, D., & Payne, S. A. (1 March 2009). Deep levels in GaTe and GaTe:In crystals investigated by deep-level transient spectroscopy and photoluminescence. Journal of Applied Physics, 105(5), #053709.

http://dx.doi.org/10.1063/1.3080157

http://scitation.aip.org/content/aip/journal/jap/105/5/10.1063/1.3080157

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