Recent Developments in Thermoelectric Metrology at NIST

Author(s)

W. Wong-Ng
J. Martin
E. L. Thomas
M. Otani
N. Lowhorn
M. Green
G. Liu
Y. G. Yan
Jason R. Hattrick-Simpers, University of South Carolina - ColumbiaFollow
T. Tran

Document Type

Book Chapter

Publication Info

Published in Advances in Electroceramic Materials III, Volume 221, Issue 23, 2010, pages 253-264.

©Advances in Electroceramic Materials III 2010, John Wiley & Sons (Wiley).

Wong-Nb, W., martin, J., Thomas, E. L., Otani, M., Lowhorn, N., Green, M., Liu, G., Yan, Y. G., Hattrick-Simpers, J., & Tran, T. (2010). Recent Developments in Thermoelectric Metrology at NLST. Advances in Electroceramic Materials II, 221 (23). http://dx.doi.org/10.1002/9780470930915.ch23

Rights

©Advances in Electroceramic Materials III 2010, John Wiley & Sons (Wiley).

Wong-Nb, W., martin, J., Thomas, E. L., Otani, M., Lowhorn, N., Green, M., Liu, G., Yan, Y. G., Hattrick-Simpers, J., & Tran, T. (2010). Recent Developments in Thermoelectric Metrology at NLST. Advances in Electroceramic Materials II, 221 (23). http://dx.doi.org/10.1002/9780470930915.ch23