We have developed an infrared imaging setup enabling in situ infrared images to be acquired, and expanded on capabilities of an infrared imaging as a high-throughput screening technique, determination of a critical thickness of a Pd capping layer which significantly blocks infrared emission from below, enhancement of sensitivity to hydrogenation and dehydrogenation by normalizing raw infrared intensity of a Mg thin film to an inert reference, rapid and systematic screening of hydrogenation and dehydrogenation properties of a Mg–Ni composition spread covered by a thickness gradient Pd capping layer, and detection of formation of a Mg2Si phase in a Mg thin film on a thermally oxidized Si substrate during annealing.
Published in Review of Scientific Instruments, Volume 80, Issue 7, 2009, pages #073707-.
©Review of Scientific Instruments 2009, AIP (American Institute of Physics).
Oguchi, H., Hattrick-Simpers, J., Takeuchi, I., Geilweil, E. J., & Bendersky, L. A. (July 2009). An Infrared Imaging Method for High-Throughput Combinatorial Investigation of Hydrogenation-Dehydrogenation and New Phase Formation of Thin Films. Review of Scientific Instruments, 80 (7), #073707. http://dx.doi.org/10.1063/1.3184024