A method is presented for predicting shunt currents in stacks of bipolar plate cells with conducting manifolds. The method is based on the requirement that the potential drop through the solution in a manifold be large enough to force current to leave the solution and to enter the conducting manifold. The current that leaves the solution in the manifold enters the conducting manifold at the anode end of the stack and returns to the solution at the cathode end. This could cause catastrophic failure of a manifold.
Journal of the Electrochemical Society, 1988, pages 1609-1612.
© The Electrochemical Society, Inc. 1988. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS). The archival version of this work was published in the Journal of the Electrochemical Society.