Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000

Author(s)

Michael A. Sutton, University of South Carolina - ColumbiaFollow
N. Li
D. Garcia
N. Cornille
J. J. Orteu
S. R. McNeill
H. W. Schreier
Xiaodong Li, University of South Carolina - ColumbiaFollow
Anthony P. Reynolds, University of South Carolina - ColumbiaFollow

Document Type

Article

Publication Info

Published in Experimental Mechanics, Volume 47, Issue 6, 2007, pages 789-804.

©Experimental Mechanics 2007, Springer.

Sutton, M. A., Li, N., Garcia, D., Cornille, N., Orteu, J. J., McNeill, S. R., Schreier, H. W., Li, X., & Reynolds, A. P. (1 December 2007). Scanning electron Microscopy for Quantitative Small and large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000. Experimental Mechanics, 47 (6), 789 – 804. http://dx.doi.org/10.1007/s11340-007-9041-0

Rights

©Experimental Mechanics 2007, Springer.

Sutton, M. A., Li, N., Garcia, D., Cornille, N., Orteu, J. J., McNeill, S. R., Schreier, H. W., Li, X., & Reynolds, A. P. (1 December 2007). Scanning electron Microscopy for Quantitative Small and large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000. Experimental Mechanics, 47 (6), 789 – 804. http://dx.doi.org/10.1007/s11340-007-9041-0