In Situ Nanoscale In-Plane Deformation Studies of Ultrathin Polymeric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques

Author(s)

Xiaodong Li, University of South Carolina - ColumbiaFollow
Weijiang Xu
Michael A. Sutton, University of South Carolina - ColumbiaFollow
M. Mello

Document Type

Article

Publication Info

Published in IEEE Transactions on Nanotechnology, Volume 6, Issue 1, 2007, pages 4-12.

©IEEE Transactions on Nanotechnology 2007, Institute of Electrical and Electronics Engineers.

Li, X., Xu, W., Sutton, M. A., & Mello, M. (15 January 2007). In Situ Nanoscale In-Plane Deformation Studies of Ultrathin Polymetric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques. IEEE Transactions on Nanotechnology, 6 (1), 4 – 12. http://dx.doi.org/10.1109/TNANO.2006.888527

Rights

©IEEE Transactions on Nanotechnology 2007, Institute of Electrical and Electronics Engineers.

Li, X., Xu, W., Sutton, M. A., & Mello, M. (15 January 2007). In Situ Nanoscale In-Plane Deformation Studies of Ultrathin Polymetric Films During Tensile Deformation Using Atomic Force Microscopy and Digital Image Correlation Techniques. IEEE Transactions on Nanotechnology, 6 (1), 4 – 12. http://dx.doi.org/10.1109/TNANO.2006.888527