Data Analysis in Combinatorial Experiments: Applying Supervised Principal Component Technique to Investigate the Relationship between ToF-SIMS Spectra and the Composition Distribution of Ternary Metallic Alloy Thin Films

Author(s)

Rossana Dell'Anna
Palo Lazzeri
Roberto Canteri
Christian J. Long
Jason R. Hattrick-Simpers, University of South Carolina - ColumbiaFollow
Ichiro Takeuchi
Mariano Anderle

Document Type

Article

Publication Info

Published in QSAR & Combinatorial Science, Volume 27, Issue 2, 2008, pages 171-178.

©QSAR & Combinatorial Science 2008, Wiley-VCH Verlag.

Dell’Anna, R., Lazzeri, P., Canteri, R., Long, C. J., Hattrick-Simpers, J., Takeuchi, I., & Anderle, M. (February 2008). Data Analysis in Combinatorial Experiments: Applying Supervised Principal Component Technique to Investigate the Relationship between ToF-SIMS Spectra and the Composition Distribution of Ternary Metallic Alloy Thin Films. QSAR & Combinatorial Science, 27 (2), 171 – 178. http://dx.doi.org/10.1002/qsar.200740008

Rights

©QSAR & Combinatorial Science 2008, Wiley-VCH Verlag.

Dell’Anna, R., Lazzeri, P., Canteri, R., Long, C. J., Hattrick-Simpers, J., Takeuchi, I., & Anderle, M. (February 2008). Data Analysis in Combinatorial Experiments: Applying Supervised Principal Component Technique to Investigate the Relationship between ToF-SIMS Spectra and the Composition Distribution of Ternary Metallic Alloy Thin Films. QSAR & Combinatorial Science, 27 (2), 171 – 178. http://dx.doi.org/10.1002/qsar.200740008