Multimode Quantitative Scanning Microwave Microscopy of In Situ Grown Epitaxial Ba_1-xSr_xTiO₃ Composition Spreads

Author(s)

K. S. Chang
M. Aronova
O. Famodu
I. Takeuchi
S. E. Lofland
Jason R. Hattrick-Simpers, University of South Carolina - ColumbiaFollow
H. Chang

Document Type

Article

Abstract

We have performed variable-temperature multimode quantitative microwavemicroscopy of in situepitaxial Ba_1−xSr_xTiO₃ thin-film composition spreads fabricated on (100) LaA₁O₃ substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO₃ to SrTiO₃. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba_1−xSr_xTiO₃ at microwave frequencies.

Publication Info

Published in Applied Physics Letters, Volume 79, Issue 26, 2001, pages #4411-.

Rights

©Applied Physics Letters 2001, AIP (American Institute of Physics).

Chang, K. S., Aronova, M., Famodu, O., Takeuchi, I., Lofland, S. E., Hattrick-Simpers, J., & Chang, H. (2001). Multimode Quantitative Scanning Microwave Microscopy of In Situ Grown Epitaxial Ba_1-xSr_xTiO₃ Composition Spreads. Applied Physics Letters, 79 (26), #4411. http://dx.doi.org/10.1063/1.1427438