Demonstration of Magnetoelectric Scanning Probe Microscopy

Author(s)

Jason R. Hattrick-Simpers, University of South Carolina - ColumbiaFollow
Liyang Dai
Manfred Wuttig
Ichiro Takeuchi
Eckhard Quandt

Document Type

Article

Abstract

A near-field room temperature scanning magnetic probe microscope has been developed using a laminated magnetoelectric sensor. The simple trilayer longitudinal-transverse mode sensor, fabricated using Metglas as the magnetostrictive layer and polyvinylidene fluoride as the piezoelectric layer, shows an ac field sensitivity of 467±3μV∕O_e in the measured frequency range of 200Hz–8kHz. The microscope was used to image a 2mm diameter ring carrying an ac current as low as 10⁻⁵A. ac fields as small as 3×10⁻¹⁰T have been detected.

Publication Info

Published in Review of Scientific Instruments, Volume 78, Issue 10, 2007, pages #106103-.

Rights

©Review of Scientific Instruments 2007, AIP (American Institute of Physics).

Hattrick-Simpers, J. R., Dai, L., Wutting, M., Takeuchi, I., & Quandt, E. (October 2007). Demonstration of Magnetoelectric Scanning Probe Microscopy. Review of Scientific Instruments, 78 (10), #106103. http://dx.doi.org/10.1063/1.2777197