Polycrystalline Si1-xGex Thin Film Deposition by Rapid Thermal Chemical Vapor Deposition

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©Journal of Materials Science: Materials in Electronics 2006, Springer.

Park, Y-B., Choi, Y-W., Li, X. (1 January 2006). Polycrystalline Si1-xGex Thin Film Deposition by Rapid Thermal Chemical Vapor Deposition. Journal of Materials Science: Materials in Electronics, 17 (10), 27 – 33. http://dx.doi.org/10.1007/s10854-005-5138-3

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