Characterization of X-Ray Imaging Properties of PbI₂ Films

Author(s)

K. S. Shah
P. Bennett
L. Cirignano
Y. Dmitriyev
M. Klugerman
K. C. Mandal, University of South Carolina - ColumbiaFollow
L. P. Moy
R. A. Street

Document Type

Article

Subject Area(s)

Electrical Engineering

Publication Info

Published in MRS Proceedings, Volume 487, 1998, pages 351-360.

© MRS Proceedings 1998, Cambridge University Press

Shah, K. S., Bennett, P., Cirignano, L., Dmitriyev, Y., Klugerman, M., Mandal, K. C., Moy, L. P., & Street, R. A. (1998). Characterization of x-ray imaging properties of PbI₂ films. MRS Proceedings, 487, 351-360.

http://dx.doi.org/10.1557/PROC-487-351

Rights

© MRS Proceedings 1998, Cambridge University Press

Shah, K. S., Bennett, P., Cirignano, L., Dmitriyev, Y., Klugerman, M., Mandal, K. C., Moy, L. P., & Street, R. A. (1998). Characterization of x-ray imaging properties of PbI₂ films. MRS Proceedings, 487, 351-360.

http://dx.doi.org/10.1557/PROC-487-351