Characterization of Low-Defect Cd_0.9Zn_0.1Te and CdTe Crystals for High-Performance Frisch Collar Detectors

Author(s)

K. C. Mandal, University of South Carolina - ColumbiaFollow
S. H. Kang
M. Choi
A. Kargar
M. J. Harrison
D. S. McGregor
A. E. Bolotnikov
G. A. Carini
G. C. Camarda
R. B. James

Document Type

Article

Subject Area(s)

Nuclear Science, Electrical Engineering

Publication Info

Published in IEEE Transactions on Nuclear Science, Volume 54, Issue 4, 2007, pages 802-806.

© IEEE Transactions on Nuclear Science 2007, Institute of Electrical and Electronics Engineers

Mandal, K. C., Kang, S. H., Choi, M., Kargar, A., Harrison, M. J., McGregor, D. S., Bolotnikov, A. E., Carini, G. A., Camarda, G. C., & James, R. B. (2007). Characterization of low-defect Cd_0.9Zn_0.1Te and CdTe crystals for high-performance Frisch collar detectors. IEEE Transactions on Nuclear Science, 54(4), 802-806.

http://dx.doi.org/10.1109/TNS.2007.902371

Rights

© IEEE Transactions on Nuclear Science 2007, Institute of Electrical and Electronics Engineers

Mandal, K. C., Kang, S. H., Choi, M., Kargar, A., Harrison, M. J., McGregor, D. S., Bolotnikov, A. E., Carini, G. A., Camarda, G. C., & James, R. B. (2007). Characterization of low-defect Cd_0.9Zn_0.1Te and CdTe crystals for high-performance Frisch collar detectors. IEEE Transactions on Nuclear Science, 54(4), 802-806.

http://dx.doi.org/10.1109/TNS.2007.902371