Biparametric Analyses of Charge Trapping in Cd_0.9Zn_0.1Te Based Virtual Frisch Grid Detectors

Author(s)

S. K. Chaudhuri
K. J. Zavalla
R. M. Krishna
K. C. Mandal, University of South Carolina - ColumbiaFollow

Document Type

Article

Subject Area(s)

Engineering, Electrical Engineering

Publication Info

Published in Journal of Applied Physics, Volume 113, Issue 7, 2013, pages 074504-1-074504-6.

© Journal of Applied Physics 2013, American Institute of Physics

Chaudhuri, S. K., Zavalla, K. J., Krishna, R. M., & Mandal, K. C. (21 February 2013). Biparametric analyses of charge trapping in Cd_0.9Zn_0.1Te based virtual Frisch grid detectors. Journal of Applied Physics, 113(7), #074504.

http://dx.doi.org/10.1063/1.4793268

http://scitation.aip.org/content/aip/journal/jap/113/7/10.1063/1.4793268

Rights

© Journal of Applied Physics 2013, American Institute of Physics

Chaudhuri, S. K., Zavalla, K. J., Krishna, R. M., & Mandal, K. C. (21 February 2013). Biparametric analyses of charge trapping in Cd_0.9Zn_0.1Te based virtual Frisch grid detectors. Journal of Applied Physics, 113(7), #074504.

http://dx.doi.org/10.1063/1.4793268

http://scitation.aip.org/content/aip/journal/jap/113/7/10.1063/1.4793268