Strain-Engineered Novel III-N Electronic Devices with High Quality Dielectric/Semiconductor Interfaces

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©Physcia Status Solidi (a) 2003, Wiley VCH-Verlag.

Khan, M. A., Shur, M. S. & Simin, G. (November 2003). Strain-Engineered Novel III-N Electronic Devices with High Quality Dielectric/Semiconductor Interfaces. Physica Status Solidi (a), 200 (1), 155-160. http://dx.doi.org/10.1002/pssa.200303339

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