Submicron Gate Si3N4/AlGaN/GaN-Metal-Insulator-Semiconductor Heterostructure Field-Effect Transistors
Document Type
Article
Publication Info
Published in IEEE Electron Device Letters, Volume 24, Issue 9, 2003, pages 541-543.
Rights
©IEEE Electron Device Letters 2003, Institute of Electrical and Electronics Engineers (IEEE).
Adivarahan, V., Gaevski, M., Sun, W. H., Fatima, H., Koudymov, A., Saygi, S., Simin, G., Yang, J., Khan, M. A., Tarakji, A., Shur, M. S., & Gaska, R. (September 2003). Submicron Gate Si3N4/AlGaN/GaN-Metal-Insulator-Semiconductor Heterostructure Field-Effect Transistors. IEEE Electron Device Letters, 24 (9), 541-543. http://dx.doi.org/10.1109/LED.2003.816574
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