Mapping Nanoscale Wear Field by Combined Atomic Force Microscopy and Digital Image Correlation Techniques

Author(s)

Zhi-Hui Xu
Michael A. Sutton, University of South Carolina - ColumbiaFollow

Document Type

Article

Publication Info

Published in Acta Materialia, Volume 56, Issue 20, 2008, pages 6304-6309.

©Acta Materialia 2008. Elsevier.

Xu, Z-H., Sutton, M. A., & Li, X. (December 2008). Mapping Nanoscale Wear Field by Combined Atomic Force Microscopy and Digital Image Correllation Techniques. Acta Materialia, 56 (20), 6304 – 6309. http://dx.doi.org/10.1016/j.actamat.2008.08.044

Rights

©Acta Materialia 2008. Elsevier.

Xu, Z-H., Sutton, M. A., & Li, X. (December 2008). Mapping Nanoscale Wear Field by Combined Atomic Force Microscopy and Digital Image Correllation Techniques. Acta Materialia, 56 (20), 6304 – 6309. http://dx.doi.org/10.1016/j.actamat.2008.08.044