Ellipsomicroscopy For Surface Imaging: Contrast Mechanism, Enhancement, And Application To CO oxidation on Pt(110)
Document Type
Article
Subject Area(s)
Engineering, Chemical Engineering, Catalysis and Reaction Engineering
Abstract
Ellipsomicroscopy for surface imaging (EMSI) is a powerful new tool for studying spatiotemporal adsorbate pattern formation on catalyst surfaces. It is a surface-sensitive technique that is able to measure submonolayer coverage of adsorbates. The imaging of the sample’s surface achieves a spatial sensitivity, making it possible to measure nonuniformity of adsorbate coverage. The image contrast, however, depends strongly on the setup of the instrument. The optimum setup can be calculated from the ellipsometric properties of the catalyst/adsorbate system and the intrinsic parameters of the EMSI instrument. Optimizing the setup of the EMSI instrument permitted enhancement of the image contrast over the previous setup. As a result, new features in CO oxidation on Pt(110) were discovered.
Digital Object Identifier (DOI)
Publication Info
Published in Journal of the American Optical Society A: Optics, Image Science, and Vision, Volume 17, Issue 1, 2000, pages 135-141.
© Journal of the Optical Society of America A, 2000, Optical Society for America
APA Citation
Dicke, J., Rotermund, H.H., Lauterbach, A.J. (2000). Ellipsomicroscopy for surface imaging: Contrast mechanism, enhancement, and application to CO oxidation on Pt(110). Journal of the Optical Society of America A, 17(1), 135-141. http://doi.org/10.1364/JOSAA.17.000135
Rights
© Journal of the Optical Society of America A, 2000, Optical Society for America