High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements

Author(s)

Sigurd Thienhaus
Christiane Zamponi
Holger Rumpf
Jason R. Hattrick-Simpers, University of South Carolina - ColumbiaFollow
Ichiro Takeuchi
Alfred Ludwig

Document Type

Article

Publication Info

Published in MRS Proceedings, Volume 894, 2005, pages LL06-06-.

©MRS Proceedings 2005, Cambridge University Press.

Thienhaus, S., Zamponi, C., Rumpf, H., Hattrick-Simpers, J., Takeuchi, I., & Ludwig, A. (2005). High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements. MRS Proceedings, 894, LL06-06. http://dx.doi.org/10.1557/PROC-0894-LL06-06

Rights

©MRS Proceedings 2005, Cambridge University Press.

Thienhaus, S., Zamponi, C., Rumpf, H., Hattrick-Simpers, J., Takeuchi, I., & Ludwig, A. (2005). High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements. MRS Proceedings, 894, LL06-06. http://dx.doi.org/10.1557/PROC-0894-LL06-06