Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000, Michael A. Sutton, N. Li, D. Garcia, N. Cornille, J. J. Orteu, S. R. McNeill, H. W. Schreier, Xiaodong Li, Anthony P. Reynolds
Faculty Publications