Part of the Semiconductor and Optical Materials Commons

Works by Alfred Ludwig in Semiconductor and Optical Materials

2005

High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements, Sigurd Thienhaus, Christiane Zamponi, Holger Rumpf, Jason R. Hattrick-Simpers, Ichiro Takeuchi, Alfred Ludwig
Faculty Publications

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