Part of the Materials Science and Engineering Commons

Works by Holger Rumpf in Materials Science and Engineering

2005

High-Throughput Characterization of Shape Memory Thin Films using Automated Temperature-Dependent Resistance Measurements, Sigurd Thienhaus, Christiane Zamponi, Holger Rumpf, Jason R. Hattrick-Simpers, Ichiro Takeuchi, Alfred Ludwig
Faculty Publications

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