Characterization of Deep Levels in n-type and Semi-Insulating 4H-SiC Epitaxial Layers by Thermally Stimulated Current Spectroscopy, P. G. Muzykov, Ramesh Madhu Krishna, K. C. Mandal
Faculty Publications

Defect Correlation Studies on 4H-SiC Crystals and Epitaxial Layers for Radiation Detector Applications, K. C. Mandal, P. G. Muzykov, Ramesh Madhu Krishna, T. C. Hayes
Faculty Publications

Characterization of 4H Semi-Insulating Silicon Carbide for Radiation Detector Applications, K. C. Mandal, P. G. Muzykov, Ramesh Madhu Krishna, Sandip Das, Tangali S. Sudarshan
Faculty Publications