High Resolution Alpha Particle Detection Using 4H–SiC Epitaxial Layers: Fabrication, Characterization, and Noise Analysis, S. K. Chaudhuri, K. J. Zavalla, K. C. Mandal
Faculty Publications

Schottky Barrier Detectors on 4H-SiC n-type Epitaxial Layer for Alpha Particles, S. K. Chaudhuri, Ramesh Madhu Krishna, K. J. Zavalla, K. C. Mandal
Faculty Publications