Effect of Z_1/2, EH₅, and Ci1 Deep Defects on the Performance of n-type 4H-SiC Epitaxial Layers Schottky Detectors: Alpha Spectroscopy and Deep Level Transient Spectroscopy Studies, M. A. Mannan, S. K. Chaudhuri, K. V. Nguyen, K. C. Mandal
Faculty Publications