Investigation of CdZnTe Crystal Defects Using Scanning Spreading Resistance Microscopy

Author(s)

J. Liu
K. C. Mandal, University of South Carolina - ColumbiaFollow
Goutam Koley, University of South Carolina - ColumbiaFollow

Document Type

Article

Subject Area(s)

Engineering, Microscopy

Publication Info

Published in SPIE Proceedings, Volume 7079, 2008, pages 70790C-1-70790C-9.

© SPIE Proceedings 2008, Society of Photo-optical Instrumentation Engineers

Liu, J., Mandal, K. C., & Koley, G. (4 September 2008). Investigation of CdZnTe crystal defects using scanning spreading resistance microscopy. SPIE Proceedings, 7079, #70790C-1-9.

http://dx.doi.org/10.1117/12.796253

Rights

© SPIE Proceedings 2008, Society of Photo-optical Instrumentation Engineers

Liu, J., Mandal, K. C., & Koley, G. (4 September 2008). Investigation of CdZnTe crystal defects using scanning spreading resistance microscopy. SPIE Proceedings, 7079, #70790C-1-9.

http://dx.doi.org/10.1117/12.796253