X-Ray Imaging with Semiconductor Films

Author(s)

K. S. Shah
P. R. Bennett
L. J. Cirignano
Y. N. Dmitriyev
M. B. Klugerman
K. C. Mandal, University of South Carolina - ColumbiaFollow
L. P. Moy
R. A. Street

Document Type

Article

Subject Area(s)

Electrical Engineering, Semiconduction

Publication Info

Published in SPIE Proceedings, Volume 3446, 1998, pages 102-113.

© SPIE Proceedings 1998, Society of Photo-optical Instrumentation Engineers

Shah, K. S., Bennett, P. R., Cirignano, L. J., Dmitriyev, Y. N., Klugerman, M. B., Mandal, K. C., Moy, L. P., & Street, R. A. (1 July 1998). X-ray imaging with semiconductor films. SPIE Proceedings, 3446, 102-113.

http://dx.doi.org/10.1117/12.312883

Rights

© SPIE Proceedings 1998, Society of Photo-optical Instrumentation Engineers

Shah, K. S., Bennett, P. R., Cirignano, L. J., Dmitriyev, Y. N., Klugerman, M. B., Mandal, K. C., Moy, L. P., & Street, R. A. (1 July 1998). X-ray imaging with semiconductor films. SPIE Proceedings, 3446, 102-113.

http://dx.doi.org/10.1117/12.312883