Investigation of Nanoscale Electronic Properties of CdZnTe Crystals by Scanning Spreading Resistance Microscopy

Author(s)

J. Liu
K. C. Mandal, University of South Carolina - ColumbiaFollow
Goutam Koley, University of South Carolina - ColumbiaFollow

Document Type

Article

Subject Area(s)

Semiconductor Science, Semiconductor Technology, Electrical Engineering, Optics

Publication Info

Published in Semiconductor Science and Technology, Volume 24, Issue 4, 2009, pages 045012-1-045012-5.

© Semiconductor Science and Technology 2009, IOP Publishing

Liu, J., Mandal, K. C., & Koley, G. (April 2009). Investigation of nanoscale electronic properties of CdZnTe crystals by scanning spreading resistance microscopy. Semiconductor Science and Technology, 24(4), #045012.

http://dx.doi.org/10.1088/0268-1242/24/4/045012

Rights

© Semiconductor Science and Technology 2009, IOP Publishing

Liu, J., Mandal, K. C., & Koley, G. (April 2009). Investigation of nanoscale electronic properties of CdZnTe crystals by scanning spreading resistance microscopy. Semiconductor Science and Technology, 24(4), #045012.

http://dx.doi.org/10.1088/0268-1242/24/4/045012