XPS Investigation of CdTe Surfaces: Effect of Ru Modification

Author(s)

D. N. Bose
M. S. Hedge
S. Basu
K. C. Mandal, University of South Carolina - ColumbiaFollow

Document Type

Article

Subject Area(s)

Electrical Engineering, Semiconductor Science, Semiconductor Technology

Publication Info

Published in Semiconductor Science and Technology, Volume 4, Issue 10, 1989, pages 866-870.

© Semiconductor Science and Technology 1989, IOP Publishing

Bose, D. N., Hedge, M. S., Basu, S., & Mandal, K. C. (October 1989). XPS investigation of CdTe surfaces: effect of Ru modification. Semiconductor Science and Technology, 4(10), 866-870.

http://dx.doi.org/10.1088/0268-1242/4/10/006

Rights

© Semiconductor Science and Technology 1989, IOP Publishing

Bose, D. N., Hedge, M. S., Basu, S., & Mandal, K. C. (October 1989). XPS investigation of CdTe surfaces: effect of Ru modification. Semiconductor Science and Technology, 4(10), 866-870.

http://dx.doi.org/10.1088/0268-1242/4/10/006