High Resolution Alpha Particle Detection Using 4H–SiC Epitaxial Layers: Fabrication, Characterization, and Noise Analysis

Author(s)

S. K. Chaudhuri
K. J. Zavalla
K. C. Mandal, University of South Carolina - ColumbiaFollow

Document Type

Article

Subject Area(s)

Electrical Engineering, Engineering Physics

Publication Info

Published in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Volume 728, 2013, pages 97-101.

© Nuclear Instruments and Methods in Physics Research A: Accelerators, Spectrometers, Detectors and Associated Equipment 2013, Elsevier

Chaudhuri, S. K., Zavalla, K. J., & Mandal, K. C. (11 November 2013). High resolution alpha particle detection using 4H-SiC epitaxial layers: Fabrication, characterization, and noise analysis. Nuclear Instruments and Methods in Physics Research A: Accelerators, Spectrometers, Detectors and Associated Equipment, 728, 97-101.

http://dx.doi.org/10.1016/j.nima.2013.06.076

Rights

© Nuclear Instruments and Methods in Physics Research A: Accelerators, Spectrometers, Detectors and Associated Equipment 2013, Elsevier

Chaudhuri, S. K., Zavalla, K. J., & Mandal, K. C. (11 November 2013). High resolution alpha particle detection using 4H-SiC epitaxial layers: Fabrication, characterization, and noise analysis. Nuclear Instruments and Methods in Physics Research A: Accelerators, Spectrometers, Detectors and Associated Equipment, 728, 97-101.

http://dx.doi.org/10.1016/j.nima.2013.06.076