Document Type

Article

Abstract

We present an experimental and theoretical study of nonresonant detection of subterahertz radiation in GaAs/AlGaAs and GaN/AlGaN heterostructurefield effect transistors. The experiments were performed in a wide range of temperatures (8–300 K) and for frequencies ranging from 100 to 600 GHz. The photoresponse measured as a function of the gate voltage exhibited a maximum near the threshold voltage. The results were interpreted using a theoretical model that shows that the maximum in photoresponse can be explained by the combined effect of exponential decrease of the electron density and the gate leakage current.

Rights

©Journal of Applied Physics 2002, American Institute of Physics (AIP).

Knap, W., Kachorovskii, V., Deng, Y., Rumyantsev, S., Lu, J-Q., Gaska, R., Shur, M. S., Simin, G., Hu, X., Khan, M. A., Saylor, C. A., & Brunel, L. C. (1 June 2002). Nonresonant Detection of Terahertz Radiation in Field Effect Transistors. Journal of Applied Physics, 91 (11), 9346-9353. http://dx.doi.org/10.1063/1.1468257

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